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Approach to universal self-similar attractor for...
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Approach to universal self-similar attractor for the levelling of thin liquid films

Abstract

We compare the capillary levelling of a random surface perturbation on a thin polystyrene film with a theoretical study on the two-dimensional capillary-driven thin film equation. Using atomic force microscopy, we follow the time evolution of samples prepared with different initial perturbations of the free surface. In particular, we show that the surface profiles present long term self-similarity, and furthermore, that they converge to a universal self-similar attractor that only depends on the volume of the perturbation, consistent with the theory. Finally, we look at the convergence time for the different samples and find very good agreement with the analytical predictions.

Authors

Benzaquen M; Fowler P; Jubin L; Salez T; Dalnoki-Veress K; Raphaël E

Publication date

July 8, 2014

DOI

10.48550/arxiv.1407.2001

Preprint server

arXiv
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