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Atomic-scale identification of novel planar defect...
Preprint

Atomic-scale identification of novel planar defect phases in heteroepitaxial YBa$_2$Cu$_3$O$_{7-\delta}$ thin films

Abstract

We have discovered two novel types of planar defects that appear in heteroepitaxial YBa$_2$Cu$_3$O$_{7-\delta}$ (YBCO123) thin films, grown by

Authors

Gauquelin N; Zhang H; Zhu G; Wei JYT; Botton GA

Publication date

October 29, 2017

DOI

10.48550/arxiv.1710.10667

Preprint server

arXiv