Journal article
One-Dimensional LSTM-Regulated Deep Residual Network for Data-Driven Fault Detection in Electric Machines
Abstract
Authors
Mohammad-Alikhani A; Nahid-Mobarakeh B; Hsieh M-F
Journal
IEEE Transactions on Industrial Electronics, Vol. 71, No. 3, pp. 3083–3092
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
March 1, 2024
DOI
10.1109/tie.2023.3265054
ISSN
0278-0046