Ellipsometry as a probe of crystallization kinetics in thin diblock copolymer films

Abstract We present results on the use of ellipsometry as a novel probe for the crystallization kinetics in thin films of a diblock copolymer. Ellipsometry makes use of the change in polarization induced upon the reflection of light from a film‐covered substrate to enable the calculation of the refractive index and thickness of the film. The information obtained with these measurements can be compared with information from differential …