Journal article
Efficient estimation of the mean of an exponential distribution when two outliers are present
Abstract
Authors
Alexander TL; Balakrishnan N
Journal
Microelectronics Reliability, Vol. 35, No. 1, pp. 57–63
Publisher
Elsevier
Publication Date
January 1, 1995
DOI
10.1016/0026-2714(94)00049-t
ISSN
0026-2714