Journal article
Reliability estimation and tolerance limits for Laplace distribution based on censored samples
Abstract
Authors
Balakrishnan N; Chandramouleeswaran MP
Journal
Microelectronics Reliability, Vol. 36, No. 3, pp. 375–378
Publisher
Elsevier
Publication Date
January 1, 1996
DOI
10.1016/0026-2714(95)00073-9
ISSN
0026-2714