Journal article
BLUEs of location and scale parameters of laplace distribution based on type-II censored samples and associated inference
Abstract
Authors
Balakrishnan N; Chandramouleeswaran MP; Ambagaspitiya RS
Journal
Microelectronics Reliability, Vol. 36, No. 3, pp. 371–374
Publisher
Elsevier
Publication Date
January 1, 1996
DOI
10.1016/0026-2714(95)00072-0
ISSN
0026-2714