EM algorithm for one-shot device testing under the exponential distribution

The EM algorithm is a powerful technique for determining the maximum likelihood estimates (MLEs) in the presence of binary data since the maximum likelihood estimators of the parameters cannot be expressed in a closed-form. In this paper, we consider one-shot devices that can be used only once and are destroyed after use, and so the actual observation is on the conditions rather than on the real lifetimes of the devices under test. Here, we …