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Planning step-stress test plans under Type-I...
Journal article

Planning step-stress test plans under Type-I censoring for the log-location-scale case

Abstract

In this paper, we consider a k-level step-stress accelerated life-testing (ALT) experiment with unequal duration steps τ=(τ1, …, τ k ). Censoring is allowed only at the change-stress point in the final stage. A general log-location-scale lifetime distribution with mean life which is a linear function of stress, along with a cumulative exposure model, is considered as the working model. Under this model, the determination of the optimal choice …

Authors

Lin C-T; Chou C-C; Balakrishnan N

Journal

Journal of Statistical Computation and Simulation, Vol. 83, No. 10, pp. 1852–1867

Publisher

Taylor & Francis

Publication Date

October 2013

DOI

10.1080/00949655.2012.672573

ISSN

0094-9655