Journal article
Planning step-stress test plans under Type-I censoring for the log-location-scale case
Abstract
In this paper, we consider a k-level step-stress accelerated life-testing (ALT) experiment with unequal duration steps τ=(τ1, …, τ k ). Censoring is allowed only at the change-stress point in the final stage. A general log-location-scale lifetime distribution with mean life which is a linear function of stress, along with a cumulative exposure model, is considered as the working model. Under this model, the determination of the optimal choice …
Authors
Lin C-T; Chou C-C; Balakrishnan N
Journal
Journal of Statistical Computation and Simulation, Vol. 83, No. 10, pp. 1852–1867
Publisher
Taylor & Francis
Publication Date
October 2013
DOI
10.1080/00949655.2012.672573
ISSN
0094-9655