Journal article
Destructive negative binomial cure rate model and EM-based likelihood inference under Weibull lifetime
Abstract
Authors
Pal S; Balakrishnan N
Journal
Statistics & Probability Letters, Vol. 116, , pp. 9–20
Publisher
Elsevier
Publication Date
September 1, 2016
DOI
10.1016/j.spl.2016.04.005
ISSN
0167-7152