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Half-life of 176Lu
Journal article

Half-life of 176Lu

Abstract

The half-life of 176Lu has been measured using a γ-γ coincidence technique and was found to be T1/2=(4.08±0.03)×1010 years. The method employed eliminates most of the uncertainties associated with detector efficiencies, solid angle coverage, internal conversion, self-absorption, angular correlations, and true coincidence summing.

Authors

Grinyer GF; Waddington JC; Svensson CE; Austin RAE; Ball GC; Hackman G; O’Meara JM; Osborne C; Sarazin F; Scraggs HC

Journal

Physical Review C, Vol. 67, No. 1,

Publisher

American Physical Society (APS)

Publication Date

January 1, 2003

DOI

10.1103/physrevc.67.014302

ISSN

2469-9985

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