The half-life of ¹⁷⁶Lu by a γ–γ coincidence measurement Journal Articles

abstract

• The half-life of 176Lu has been measured to be T1/2 = 3.59 ± 0.05 × 1010 years. Coincidences between pairs of Ge detectors were used to eliminate the uncertainties associated with detector efficiency, solid angle, and gamma ray absorption.

authors

• Sguigna, AP
• Larabee, AJ
• Waddington, James Charles

status

• published 

publication date

• March 1, 1982

has subject area

• 01 Mathematical Sciences (FoR)
• 02 Physical Sciences (FoR)
• General Physics (Science Metrix)

published in

• Canadian Journal of Physics  Journal

keywords

• Physical Sciences
• Physics
• Physics, Multidisciplinary
• Science & Technology

Digital Object Identifier (DOI)

• 10.1139/p82-049

start page

• 361

end page

• 364

volume

• 60

issue

• 3