The half-life of 176Lu by a γ–γ coincidence measurement Academic Article uri icon

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abstract

  • The half-life of 176Lu has been measured to be T1/2 = 3.59 ± 0.05 × 1010 years. Coincidences between pairs of Ge detectors were used to eliminate the uncertainties associated with detector efficiency, solid angle, and gamma ray absorption.

publication date

  • March 1, 1982