Journal article
The half-life of 176Lu by a coincidence measurement
Abstract
The half-life of 176 Lu has been measured to be T 1/2 = 3.59 ± 0.05 × 10 10 years. Coincidences between pairs of Ge detectors were used to eliminate the uncertainties associated with detector efficiency, solid angle, and gamma ray absorption.
Authors
Sguigna AP; Larabee AJ; Waddington JC
Journal
Canadian Journal of Physics, Vol. 60, No. 3, pp. 361–364
Publisher
Canadian Science Publishing
Publication Date
March 1, 1982
DOI
10.1139/p82-049
ISSN
0008-4204