Journal article
Defect free strain relaxation of microcrystals on mesoporous patterned silicon
Abstract
A perfectly compliant substrate would allow the monolithic integration of high-quality semiconductor materials such as Ge and III-V on Silicon (Si) substrate, enabling novel functionalities on the well-established low-cost Si technology platform. Here, we demonstrate a compliant Si substrate allowing defect-free epitaxial growth of lattice mismatched materials. The method is based on the deep patterning of the Si substrate to form …
Authors
Heintz A; Ilahi B; Pofelski A; Botton G; Patriarche G; Barzaghi A; Fafard S; Arès R; Isella G; Boucherif A
Journal
Nature Communications, Vol. 13, No. 1,
Publisher
Springer Nature
DOI
10.1038/s41467-022-34288-4
ISSN
2041-1723