Journal article
A Tensor-based t-SVD-LSTM Remaining Useful Life Prediction Model for Industrial Intelligence
Abstract
Authors
Wang X; Yang LT; Cao E; Guo L; Ren L; Deen MJ
Journal
IEEE Transactions on Industrial Informatics, Vol. PP, No. 99, pp. 1–12
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2022
DOI
10.1109/tii.2022.3220854
ISSN
1551-3203