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XANES and XEOL Investigation of Cerium and Terbium...
Journal article

XANES and XEOL Investigation of Cerium and Terbium Co-Doped Silicon Oxide Films

Authors

Wilson PR; Khatami Z; Dabkowski R; Dunn K; Chelomentsev E; Wojcik J; Mascher P

Journal

ECS Meeting Abstracts, Vol. MA2012-01, No. 19, pp. 832–832

Publisher

The Electrochemical Society

Publication Date

February 15, 2012

DOI

10.1149/ma2012-01/19/832

ISSN

2151-2043

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