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(Invited) Characterization of Novel Nanostructured...
Journal article

(Invited) Characterization of Novel Nanostructured Terbium Doped Oxygen Rich Silicon Oxide for Photonic Applications

Abstract

Rare earth doped silicon-based thin films can be used for light emitting applications, where the control of dopant type and concentration plays a significant role in the enhancement of optical functionalities [1]. In this work, nanostructured terbium (Tb) doped oxygen-rich silicon oxide (ORSO) samples were fabricated using a novel fabrication technique: integrated sputtering and plasma enhanced chemical vapor deposition (PECVD) [2]. The Tb …

Authors

Khatami Z; Mascher P

Journal

ECS Meeting Abstracts, Vol. MA2020-01, No. 16, pp. 1071–1071

Publisher

The Electrochemical Society

Publication Date

May 1, 2020

DOI

10.1149/ma2020-01161071mtgabs

ISSN

2151-2043