Journal article
Random Telegraph Signal Noise in CMOS Imagers and Its Impact on Image Quality
Authors
Majumder S; El-Desouki MM; Marinov O; Deen MJ
Journal
ECS Meeting Abstracts, Vol. MA2010-01, No. 19, pp. 1066–1066
Publisher
The Electrochemical Society
Publication Date
February 5, 2010
DOI
10.1149/ma2010-01/19/1066
ISSN
2151-2043