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In Situ Study of ALD Processes Using...
Journal article

In Situ Study of ALD Processes Using Synchrotron-based X-ray Fluorescence and Scattering Techniques

Authors

Dendooven J; Devloo-Casier K; Ide M; Grandfield K; Ludwig KF; Bals S; Van Der Voort P; Detavernier C

Journal

ECS Meeting Abstracts, Vol. MA2012-02, No. 28, pp. 2460–2460

Publisher

The Electrochemical Society

Publication Date

June 4, 2012

DOI

10.1149/ma2012-02/28/2460

ISSN

2151-2043