Journal article
Half-Life of the 482keV Level of 181Ta
Abstract
A delayed coincidence measurement of the half-life of the 482 keV level of 181 Ta has been performed. In the analysis, careful attention was directed towards system nonlinearities and an accurate method of TAC calibration. The result is T 1/2 = 10.81 ± 0.05 ns.
Authors
Lowe LM; Zmora H; Prestwich WV
Journal
Canadian Journal of Physics, Vol. 51, No. 14, pp. 1497–1498
Publisher
Canadian Science Publishing
Publication Date
July 15, 1973
DOI
10.1139/p73-198
ISSN
0008-4204