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P‐176: Degradation of Blue Phosphorescent and...
Journal article

P‐176: Degradation of Blue Phosphorescent and Fluorescent Organic Light‐Emitting Diodes with Thermal Stress

Abstract

We investigated the influence of external thermal stress on blue OLEDs annealed various temperature to compare their properties to those of pristine device. Current density‐voltage‐luminance and lifetime decrease due to thermal stress, and we also used impedance spectroscopy, to obtain detailed measurements to determine the degradation mechanisms of the devices.

Authors

Lee SE; Lee HW; Baek HJ; Kim HY; Yun GJ; Kim WY; Kim YK

Journal

SID Symposium Digest of Technical Papers, Vol. 48, No. 1, pp. 1936–1939

Publisher

Wiley

Publication Date

January 1, 2017

DOI

10.1002/sdtp.12010

ISSN

0097-966X

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