Vacuum Shear Force Microscopy Application to High Resolution Work Journal Articles uri icon

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abstract

  • A new technique–Vacuum Shear Force Microscopy (VSFM)–is introduced as a reliable method for maintaining a constant separation between a probe and sample. Elimination of many of the instabilities observed when applying the shear force mechanism to imaging under ambient conditions, allows for routine nanometer lateral and sub-nanometer normal resolution. In this paper this technique is applied, firstly, to the imaging of microtubules (biology) and, secondly, to the patterning and subsequent imaging of nanoscale metal lines (nanofabrication).

authors

  • White, Jonathon
  • Polonski, Vitali V
  • Yamamoto, Yoh
  • White, Jonathon D
  • Kourogi, Motonobu
  • Ohtsu, Motoichi

publication date

  • July 1, 1999