Simple and convenient nonoptical shear force sensor for shear force and near-field optical microscopes

A simple, compact, and inexpensive method for shear force distance regulation is presented. A single piezoelectric cantilever is employed to both dither a fiber probe and to detect the decrease in piezotension-induced voltage as it approaches the sample surface. On resonance, the large piezotension-induced voltage (∼0.2 mV/nm) allows for simple electronics to be used. It is expected to find application both in shear force microscopy and for shear force distance regulation in near-field optical microscopy.