Journal article
In-Situ Soft X-Ray Spectromicroscopy Characterization of Electrochemical Processes
Abstract
Soft X-ray Scanning Transmission X-ray microscopy (STXM) is a synchrotron-based technique which can provide both spectroscopic characterization (near edge X-ray absorption fine structure, NEXAFS) and chemically selective imaging with high spatial resolution (~30 nm). Recently, we have developed in situ flow electrochemical devices [1,2] which allow control of the electrochemical environment while conducting STXM measurements, thus providing a …
Authors
Zhang C; Ingino P; Obst M; Shahcheraghi L; Yuan H; Eraky H; Wang J; Higgins D; Hitchcock AP
Journal
ECS Meeting Abstracts, Vol. MA2020-02, No. 62, pp. 3176–3176
Publisher
The Electrochemical Society
Publication Date
November 23, 2020
DOI
10.1149/ma2020-02623176mtgabs
ISSN
2151-2043