One-shot device test data analysis using non-parametric and semi-parametric inferential methods and applications

A one-shot device, such as an automobile airbag, electro-explosive unit or munition, is a product that can be used only once. Its actual lifetime is unobservable, rendering the corresponding reliability analysis quite challenging. In this paper, two non-parametric methodologies—maximum likelihood estimation via EM-algorithm and Nelson–Aalen based estimation are developed for identical testing environment on one-shot devices. The EM-algorithm is usually used for unobserved failure times under some specific parametric models. But, here the EM-algorithm is adopted for the number of failures in each time interval in a non-parametric manner. Next, a semi-parametric approach, based on proportional hazards assumption, is developed for nonidentical testing environments, such as under an accelerated life-test. A Monte Carlo simulation study is then carried out for evaluating the performance of the inferential methods developed here. Finally, two data sets are analyzed for illustrative purpose.