Robust Statistical Inference for One-Shot Devices Based on Density Power Divergences: An Overview

In this chapter, we provide a detailed review of divergence-based robust inferential methods for one-shot device testing under different lifetime distributions. Proposed estimators and Wald-type tests are shown to possess a more robust behavior than the classical maximum likelihood estimator (MLE) and Wald test. Some simulation results and real data examples are also presented to illustrate the methods detailed.