Journal article
An integrated approach for scene understanding based on Markov Random Field model
Abstract
Authors
Kim IY; Yang HS
Journal
Pattern Recognition, Vol. 28, No. 12, pp. 1887–1897
Publisher
Elsevier
Publication Date
January 1, 1995
DOI
10.1016/0031-3203(95)00061-5
ISSN
0031-3203