Physical and Chemical Characterization of Interfaces by Electron Optical Methods

Although the study of ceramics using transmission electron microscopy (TEM) lagged behind metallurgy because of specimen preparation difficulties and because many ceramics are ionisation sensitive to 100kV electron beams, today there is considerable research activity. This is due to perfection of ion thinning methods (first devised by Castaing in the early 1950’s actually for metals) and improvements in instrumentation, particularly high …