Journal article
Optimizing PWM Control for Efficiency and Reduction of False Turn-On Events in Synchronous Buck GaN Converters
Abstract
Half-bridge GaN power converters are susceptible to false turn-on events, which can lead to shoot-through and potentially device-damaging currents. There are three main parameters that can be adjusted in PWM schemes to reduce the likelihood of false turn-on events: negative gate bias, gate resistance, and deadtime. However, these PWM parameters also affect converter efficiency in the inverse way, meaning less false turn-on events must be …
Authors
Kashyap N; Bauman J
Journal
IEEE Access, Vol. 9, , pp. 146000–146009
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2021
DOI
10.1109/access.2021.3121633
ISSN
2169-3536