Characterization of organic thin film transistors with hysteresis and contact effects

We propose two procedures to extract information about the trapping processes that occur in organic thin film transistors (OTFTs) that exhibit both contact and hysteresis effects. In particular, the variation of trapped charge during hysteresis cycles is determined by the separate analysis of current–voltage curves for the intrinsic transistor and for the contact region. The extraction of these curves is done with the help of our previous …