Chapter
Chapter 3 Binary start-up demonstration tests
Abstract
Authors
Balakrishnan N; Koutras MV; Milienos FS
Book title
Reliability Analysis and Plans for Successive Testing
Pagination
pp. 25-102
Publisher
Elsevier
Publication Date
January 1, 2021
DOI
10.1016/b978-0-12-804288-5.00011-8