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Chapter 3 Binary start-up demonstration tests
Chapter

Chapter 3 Binary start-up demonstration tests

Abstract

In this chapter, we present in detail several binary start-up demonstration tests. The family of binary start-up demonstration tests includes models for which, the outcomes of the start-up procedure at each trial can be classified in two categories labeled as failure (F) or success (S). This family was the first one to be studied in the literature, and up to date a great number of models, with different acceptance and rejection criteria, has been considered. The most commonly used criteria are based (a) on uninterrupted sequences of successes and/or failures (runs), (b) on the total number of successes and/or failures (frequencies), (c) on sequences with high concentration of successes and/or failures (scans), and (d) on some alternative statistical functions of similar nature. We provide several formulas for the evaluation of their characteristics, namely the distribution and the moments of the time till a decision is reached.

Authors

Balakrishnan N; Koutras MV; Milienos FS

Book title

Reliability Analysis and Plans for Successive Testing

Pagination

pp. 25-102

Publisher

Elsevier

Publication Date

January 1, 2021

DOI

10.1016/b978-0-12-804288-5.00011-8
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