Journal article
Experimental evidence of nanometer-scale confinement of plasmonic eigenmodes responsible for hot spots in random metallic films
Abstract
We report on the identification and nanometer scale characterization over a large energy range of random, disorder-driven, surface plasmons in silver semicontinuous films embedded in silicon nitride. By performing spatially resolved electron energy loss spectroscopy experiments, we experimentally demonstrate that these plasmons eigenmodes arise when the films become fractal, leading to the emergence of strong electrical fields (“hot spots”) …
Authors
Losquin A; Camelio S; Rossouw D; Besbes M; Pailloux F; Babonneau D; Botton GA; Greffet J-J; Stéphan O; Kociak M
Journal
Physical Review B, Vol. 88, No. 11,
Publisher
American Physical Society (APS)
Publication Date
September 15, 2013
DOI
10.1103/physrevb.88.115427
ISSN
2469-9950