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Journal article

Experimental evidence of nanometer-scale confinement of plasmonic eigenmodes responsible for hot spots in random metallic films

Abstract

We report on the identification and nanometer scale characterization over a large energy range of random, disorder-driven, surface plasmons in silver semicontinuous films embedded in silicon nitride. By performing spatially resolved electron energy loss spectroscopy experiments, we experimentally demonstrate that these plasmons eigenmodes arise when the films become fractal, leading to the emergence of strong electrical fields (“hot spots”) …

Authors

Losquin A; Camelio S; Rossouw D; Besbes M; Pailloux F; Babonneau D; Botton GA; Greffet J-J; Stéphan O; Kociak M

Journal

Physical Review B, Vol. 88, No. 11,

Publisher

American Physical Society (APS)

Publication Date

September 15, 2013

DOI

10.1103/physrevb.88.115427

ISSN

2469-9950