Two-dimensional X-ray diffraction and transmission electron microscopy study on the effect of magnetron sputtering atmosphere on GaN/SiC interface and gallium nitride thin film crystal structure
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Overview
status
publication date
- March 21, 2015
has subject area
- 01 Mathematical Sciences (FoR)
- 02 Physical Sciences (FoR)
- 09 Engineering (FoR)
- Applied Physics (Science Metrix)
published in
- Journal of Applied Physics Journal