Journal article
Inside Back Cover (Phys. Status Solidi B 2/2010)
Abstract
The illustration on the inside back cover refers to the Editor's Choice article on page 248ff. Tyler Roschuk and his collaborators found luminescence from Tb‐doped silicon oxide samples to be strongly correlated to O‐related energy states using X‐ray absorption spectroscopy. The central part of the picture shows the X‐ray excited optical luminescence (XEOL) profile scanned over the O K‐edge. The upper plot depicts the total electron and …
Authors
Roschuk T; Wilson PRJ; Li J; Zalloum OHY; Wojcik J; Mascher P
Journal
physica status solidi (b), Vol. 247, No. 2,
Publisher
Wiley
Publication Date
February 2010
DOI
10.1002/pssb.201090001
ISSN
0370-1972