authors
- Jackman, TE
- Aers, GC
- McCaffrey, JP
- Britton, DT
- Willutzki, P
- Simpson, PJ
- Schultz, PJ
- Mascher, Peter
Depth Profiling of Defects in Low Temperature MBE-Grown Silicon
Journal Articles
- Overview
- Identity
- Additional Document Info
- View All
Overview
publication date
- January 1, 1992
has subject area
- 0306 Physical Chemistry (incl. Structural) (FoR)
- 0912 Materials Engineering (FoR)
- Materials (Science Metrix)
- Nanoscience & Nanotechnology (Science Metrix)
published in
- Materials Science Forum Journal