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Trapping Characteristics of the Dual States of the...
Journal article

Trapping Characteristics of the Dual States of the D-X Center in MBE Grown Si-Doped AlGaAs

Authors

Subramanian SV; Arora BM; Mahopatra YN; Kumar V

Journal

Materials Science Forum, Vol. 10-12, , pp. 405–410

Publisher

Trans Tech Publications

Publication Date

January 1, 1986

DOI

10.4028/www.scientific.net/msf.10-12.405

ISSN

0255-5476

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