Experts has a new look! Let us know what you think of the updates.

Provide feedback
Home
Scholarly Works
Trapping Characteristics of the Dual States of the...
Journal article

Trapping Characteristics of the Dual States of the D-X Center in MBE Grown Si-Doped AlGaAs

Authors

Subramanian SV; Arora BM; Mahopatra YN; Kumar V

Journal

Materials Science Forum, Vol. 10-12, , pp. 405–410

Publisher

Trans Tech Publications

Publication Date

January 1, 1986

DOI

10.4028/www.scientific.net/msf.10-12.405

ISSN

0255-5476

Labels