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Xes characterization of rare earth vanadates
Journal article

Xes characterization of rare earth vanadates

Abstract

Measurements have been made on the Kβ1,3 and Kβ5 X-ray emission lines of vanadium and on the Lβ2,15, Lγ1, Lγ2 and Lγ4 lines of rare earths. These lines were analysed in PrVO4, EuVO4, TbVO4, DyVO4, HoVO4 TmVO4 and LuVO4 single crystals, as well as in standards: V2O5, Pr2O3, Eu2O3, metallic V and other rare earths. The measurements have been performed using a single-crystal spectrometer of the Johann type with LiF analysing crystal in EPMA. The investigated crystals have been grown from PbO·V2O5 flux. The presence of V4+ ions in TbVO4 and TmVO4 crystals was detected by the analysis of the energy separation of the 3p and 3d levels. It was revealed by the observation of the multiplet splittings of the 4d52 and 4d32 levels and by the analysis of the 4f → 5d electronic transfer that the real valency of Eu and Tb ions in vanadates differs from 3 +. This was confirmed by the observation of the 5d → 2s electronic transitions.

Authors

JasioŁlek G; Da̧bkowska HA

Journal

Journal of Crystal Growth, Vol. 79, No. 1-3, pp. 534–541

Publisher

Elsevier

Publication Date

December 2, 1986

DOI

10.1016/0022-0248(86)90490-2

ISSN

0022-0248

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