Journal article
A Review on IGBT Module Failure Modes and Lifetime Testing
Abstract
Authors
Abuelnaga A; Narimani M; Bahman AS
Journal
IEEE Access, Vol. 9, , pp. 9643–9663
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2021
DOI
10.1109/access.2021.3049738
ISSN
2169-3536