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Photonic temperature and wavelength metrology by...
Journal article

Photonic temperature and wavelength metrology by spectral pattern recognition.

Abstract

Spectral pattern recognition is used to measure temperature and generate calibrated wavelength/frequency combs using a single silicon waveguide ring resonator. The ring generates two incommensurate interleaving TE and TM spectral combs that shift independently with temperature to create a spectral pattern that is unique at every temperature. Following an initial calibration, the ring temperature can be determined by recognizing the spectral …

Authors

Janz S; Cheriton R; Xu D-X; Densmore A; Dedyulin S; Todd A; Schmid JH; Cheben P; Vachon M; Dezfouli MK

Journal

Optics Express, Vol. 28, No. 12, pp. 17409–17423

Publisher

Optica Publishing Group

Publication Date

June 8, 2020

DOI

10.1364/oe.394642

ISSN

1094-4087