Journal article
Photonic temperature and wavelength metrology by spectral pattern recognition.
Abstract
Authors
Janz S; Cheriton R; Xu D-X; Densmore A; Dedyulin S; Todd A; Schmid JH; Cheben P; Vachon M; Dezfouli MK
Journal
Optics Express, Vol. 28, No. 12, pp. 17409–17423
Publisher
Optica Publishing Group
Publication Date
June 8, 2020
DOI
10.1364/oe.394642
ISSN
1094-4087