Chapter
COM‐Poisson Cure Rate Models and Associated Likelihood‐based Inference with Exponential and Weibull Lifetimes
Abstract
Authors
Balakrishnan N; Pal S
Book title
Applied Reliability Engineering and Risk Analysis
Pagination
pp. 308-348
Publisher
Wiley
Publication Date
September 12, 2013
DOI
10.1002/9781118701881.ch22