Planning step-stress test plans under Type-I hybrid censoring for the log-location-scale distribution

The optimal design of a k-level step-stress accelerated life-testing (ALT) experiment with unequal duration steps under Type-I hybrid censoring scheme for a general log-location-scale lifetime distribution is discussed here. Censoring is allowed only at the change-stress point in the final stage. Based on the cumulative exposure model, the determination of the optimal choice for Weibull, lognormal and log-logistic lifetime distributions are …