Journal article
Effect of electronic flame off parameters on copper bonding wire: Free-air ball deformability, heat affected zone length, heat affected zone breaking force
Abstract
Cu bonding wire is more and more used for interconnections to integrated circuits (ICs) to reduce cost and increase performance compared to Au wire. To eliminate underpad damage for Cu wire applications, it is worthwhile to reduce the hardness of the free-air ball (FAB). Short heat affected zone (HAZ) and high HAZ breaking load are often required for advanced microelectronics packaging in order to decrease the loop height and thereby the …
Authors
Hang CJ; Song WH; Lum I; Mayer M; Zhou Y; Wang CQ; Moon JT; Persic J
Journal
Microelectronic Engineering, Vol. 86, No. 10, pp. 2094–2103
Publisher
Elsevier
Publication Date
October 2009
DOI
10.1016/j.mee.2009.01.085
ISSN
0167-9317