Structure detection of amorphous materials

An improved version of a scheme proposed earlier is presented to reconstruct the 3-dimensional (3D) image of amorphous structure with atomic resolution. A partially attenuated X-ray beam obtained from a slant edge is scattered by the specimen's electron density of arbitrary structure, and then recorded by the intensity detector on a diffractometer. The 'phase information' is preserved and recovered by introduction the second parameter in addition to the scattering vector, viz., the slant angle of the beam attenuator. From the scattering intensity date the 3D electron density function is reconstructed directly via the Fourier + Laplace double inversion so that no linear density projections are required as intermediate steps.