High order X-ray diffraction and internal atomic layer roughness of epitaxial and bulk SiC materials
Journal Articles
- Overview
- Additional Document Info
- View All
Overview
status
publication date
- January 1, 2000
has subject area
- 0306 Physical Chemistry (incl. Structural) (FoR)
- 0912 Materials Engineering (FoR)
- Materials (Science Metrix)
- Nanoscience & Nanotechnology (Science Metrix)
published in
- Materials Science Forum Journal