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Nitrogen implantation into GaP: Damage and...
Journal article

Nitrogen implantation into GaP: Damage and nitrogen location studies

Abstract

Implantations of 80 and 40 keV nitrogen into GaP have been carried out. The implants were performed at temperatures from 25° to 400°C for total doses in the range 1015 to 10l6 cm−2. Backscattering and channeling techniques have been used to determine the associated damage and its annealing characteristics for temperatures up to 800°C . Also determined, has been the lattice location of the implanted nitrogen. This was performed by implanting …

Authors

Thompson DA; Johar SS; Shewchun J

Journal

Journal of Electronic Materials, Vol. 4, No. 2, pp. 195–207

Publisher

Springer Nature

Publication Date

April 1975

DOI

10.1007/bf02655401

ISSN

0361-5235