Quality evaluation of homopetaxial 4H-SiC thin films by a Raman scattering study of forbidden modes Academic Article uri icon

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authors

  • Wan, Lingyu
  • Zhao, Dishu
  • Wang, Fangze
  • Xu, Gu
  • Lin, Tao
  • Tin, Chin-Che
  • Feng, Zhaochi
  • Feng, Zhe Chuan

publication date

  • January 1, 2018