Algorithms for state restoration and trace-signal selection for data acquisition in silicon debug

To locate and correct design errors that escape pre-silicon verification, silicon debug has become a necessary step in the implementation flow of digital integrated circuits. Embedded logic analysis, which employs on-chip storage units to acquire data in real time from the internal signals of the circuit-underdebug, has emerged as a powerful technique for improving observability during in-system debug. However, as the amount of data that can be …