Journal article
Real-time lossless compression for silicon debug
Abstract
Silicon debug is becoming a key step in the implementation flow for the purpose of identifying and fixing design errors that have escaped pre-silicon verification. To address the lack of observability for the internal circuit nodes during silicon debug, embedded logic analysis enables real-time data acquisition from a limited number of internal signals. In this paper, we propose a novel architecture for embedded logic analysis that enables …
Authors
Daoud EA; Nicolici N
Journal
IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems, Vol. 28, No. 1, pp. 1387–1400
Publication Date
January 1, 2009
ISSN
0278-0070