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Real-time lossless compression for silicon debug
Journal article

Real-time lossless compression for silicon debug

Abstract

Silicon debug is becoming a key step in the implementation flow for the purpose of identifying and fixing design errors that have escaped pre-silicon verification. To address the lack of observability for the internal circuit nodes during silicon debug, embedded logic analysis enables real-time data acquisition from a limited number of internal signals. In this paper, we propose a novel architecture for embedded logic analysis that enables …

Authors

Daoud EA; Nicolici N

Journal

IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems, Vol. 28, No. 1, pp. 1387–1400

Publication Date

January 1, 2009

ISSN

0278-0070