Home
Scholarly Works
Power-Aware testing and test strategies for low...
Book
Power-Aware testing and test strategies for low power devices
Abstract
Managing the power consumption of circuits & systems is now considered one of the most important challenges for the semiconductor industry. This text explores existing solutions for power-aware test &design-for-test of conventional circuits and systems, & surveys test strategies &EDA solutions for testing low power devices. © Springer Science+Business Media, LLC 2010 All rights reserved.
Authors
Girard P; Nicolici N; Wen X
Pagination
pp. 1-363
Publication Date
December 1, 2010
DOI
10.1007/978-3-540-73768-1
Associated Experts
Nicola Nicolici
Professor, Faculty of Engineering
Visit profile
View published work (Non-McMaster Users)
Scholarly citations from Dimensions
Contact the Experts team
Get technical help
or
Provide website feedback