Journal article
Half-life of 176Lu
Abstract
The half-life of 176Lu has been measured using a γ-γ coincidence technique and was found to be T1/2 = (4.08 ± 0.03) × 1010 years. The method employed eliminates most of the uncertainties associated with detector efficiencies, solid angle coverage, internal conversion, self-absorption, angular correlations, and true coincidence summing.
Authors
Grinyer GF; Waddington JC; Svensson CE; Austin RAE; Ball GC; Hackman G; O'Meara JM; Osborne C; Sarazin F; Scraggs HC
Journal
Physical Review C Nuclear Physics, Vol. 67, No. 1, pp. 143021–143024
Publication Date
January 1, 2003
DOI
10.1103/PhysRevC.67.014302
ISSN
0556-2813