Half-life of 176Lu

The half-life of ¹⁷⁶Lu has been measured using a γ-γ coincidence technique and was found to be T1/2 = (4.08 ± 0.03) × 10¹⁰ years. The method employed eliminates most of the uncertainties associated with detector efficiencies, solid angle coverage, internal conversion, self-absorption, angular correlations, and true coincidence summing.