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Development of scanning X-ray microscopes for...

Journal article

Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source

Abstract

The development of two zone-plate microscopes for X-ray spectroscopic analysis of materials is described. This pair of instruments will provide imaging NEXAFS analysis of samples in transmission at atmospheric pressure and imaging XPS and NEXAFS analysis of sample surfaces in a UHV environment.

Authors

Warwick T; Ade H; Cerasari S; Denlinger J; Franck K; Garcia A; Hayakawa S; Hitchcock A; Kikuma J; Klingler S

Journal

Journal of Synchrotron Radiation, Vol. 5, No. Pt 3, pp. 1090–1092

Publisher

International Union of Crystallography (IUCr)

Publication Date

May 1, 1998

DOI

10.1107/s0909049597014283

ISSN

0909-0495

Associated Experts

Adam Percival Hitchcock

Professor Emeritus, Faculty of Science

Labels

Fields of Research (FoR)

34 Chemical Sciences 3406 Physical chemistry 5102 Atomic, molecular and optical physics 5104 Condensed matter physics

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