Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source Academic Article uri icon

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abstract

  • The development of two zone-plate microscopes for X-ray spectroscopic analysis of materials is described. This pair of instruments will provide imaging NEXAFS analysis of samples in transmission at atmospheric pressure and imaging XPS and NEXAFS analysis of sample surfaces in a UHV environment.

authors

  • Warwick, T
  • Ade, H
  • Cerasari, S
  • Denlinger, J
  • Franck, K
  • Garcia, A
  • Hayakawa, S
  • Hitchcock, Adam Percival
  • Kikuma, J
  • Klingler, S
  • Kortright, J
  • Morisson, G
  • Moronne, M
  • Rightor, E
  • Rotenberg,, E
  • Seal, S
  • Shin, H-J
  • Steele, WF
  • Tonner, BP

publication date

  • May 1, 1998