Journal article
Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source
Abstract
The development of two zone-plate microscopes for X-ray spectroscopic analysis of materials is described. This pair of instruments will provide imaging NEXAFS analysis of samples in transmission at atmospheric pressure and imaging XPS and NEXAFS analysis of sample surfaces in a UHV environment.
Authors
Warwick T; Ade H; Cerasari S; Denlinger J; Franck K; Garcia A; Hayakawa S; Hitchcock A; Kikuma J; Klingler S
Journal
Journal of Synchrotron Radiation, Vol. 5, No. Pt 3, pp. 1090–1092
Publisher
International Union of Crystallography (IUCr)
Publication Date
May 1, 1998
DOI
10.1107/s0909049597014283
ISSN
0909-0495